Two-dimensional XRD is suitable for characterization of materials of all kinds, such as metals, polymers, ceramics, semiconductors, thin films, biomaterials and composites. The presentation gives an introduction to two-dimensional X-ray diffraction, including the basic concept, the geometry convention, the relationship between diffraction space, detector space and sample space, as well as the diffraction data analysis algorithms based on diffraction vector approach.
The presentation also covers recent advances in two-dimensional X-ray diffraction instrumentation, including X-ray source, area detector and system configuration. Applications in phase identification, stress, texture, crystal size determination and reciprocal space mapping are given with experimental examples.
This three-hour workshop will cover the following key points:
- An overview of the fundamentals of two-dimensional X-Ray diffraction;
- Standard to advanced applications by the presentation of the following:
- Phase identification
- Stress measurement
- Texture, orientation and fiber analysis
- Crystallite size measurement
- Reciprocal space mapping
- Thin film and functional coating case studies
- Live Q&A session: Live questions as well as specific questions sent by the participants at least 1 week prior to the workshop will be addressed.
Please contact Etienne Bousser at firstname.lastname@example.org for additional information and questions.