Date & Time
Thursday, June 17, 2021, 1:00 PM - 4:00 PM
Surface Characterization Using XPS and Related Techniques
FCSE Session Type

In this workshop we will introduce X-ray photoelectron spectroscopy (XPS) in the context of different complementary surface and interface analytical methods, explain its strengths and limitations, and provide ample examples of specific applications.

In the first part, we will explain the basic principles of XPS and of related methods, describe the experimental requirements, and outline what it can be used for.

The second part of the workshop will focus on case studies, showcasing how XPS can be used to solve real problems in a variety of areas, including polymers, battery electrodes, catalysis, microelectronics, and others. This section will also contain a live demonstration on one of our instruments to precisely illustrate how XPS can be used to answer surface analytical questions and respond to today’s ever increasing surface performance challenges.

Finally, the third part of the workshop will consist in an interactive Q&A session, where our presenters from academia and industry will answer questions asked by attendees before or during the session. Indeed, specific questions attendees would like to have addressed can also be sent in advance to